Cell-level placement for improving substrate thermal distribution
- 1 February 2000
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 19 (2) , 253-266
- https://doi.org/10.1109/43.828554
Abstract
The dramatic increase of power consumption in very large scale integration circuits has led to high operating temperature and large thermal gradient, thereby resulting in serious timing and reliability concerns. Temperature-tracking is thus becoming of paramount importance in modern electronic design automation (EDA) tools. In this paper we present two thermal placement tools for standard cell and macro cell design styles respectively. They are aimed at reducing hot spots in a design without compromising traditional design metrics such as area and wire length. We developed a compact substrate thermal model that can be used by the placer to calculate the temperature profile of a placement efficiently, or to convert the user-specified temperature constraint into the corresponding power distribution constraint as an alternative placement objective. As a result, our method is much more efficient than directly employing temperature profile simulation during the placement process. The simulation results show noticeable improvement of thermal distribution over the traditional placement algorithm, with little impact on area and wire length of the final layout.Keywords
This publication has 18 references indexed in Scilit:
- ILLIADS-T: an electrothermal timing simulator for temperature-sensitive reliability diagnosis of CMOS VLSI chipsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1998
- Electro-thermal circuit simulation using simulator couplingIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1997
- Fully coupled dynamic electro-thermal simulationIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1997
- Realistic and efficient simulation of electro-thermal effects in VLSI circuitsIEEE Transactions on Very Large Scale Integration (VLSI) Systems, 1997
- Power Estimation in Sequential CircuitsyProceedings of the 39th conference on Design automation - DAC '02, 1995
- Substrate-aware mixed-signal macrocell placement in WRIGHTIEEE Journal of Solid-State Circuits, 1995
- Addressing substrate coupling in mixed-mode ICs: simulation and power distribution synthesisIEEE Journal of Solid-State Circuits, 1994
- Placement for reliability and routability of convectively cooled PWBsIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
- Thermal stress analysis of a multichip package designIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1989
- Computer simulation of integrated circuits in the presence of electrothermal interactionIEEE Journal of Solid-State Circuits, 1976