Resolution enhancement by deconvolution using a field emission source in electron energy loss spectroscopy
- 31 May 1992
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 41 (1-3) , 137-145
- https://doi.org/10.1016/0304-3991(92)90103-q
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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