Fabrication and Characterization of (Bi,La)4Ti3O12 Films Using LaAlO3 Buffer Layers for MFIS Structures
- 1 January 2004
- journal article
- Published by Taylor & Francis in Integrated Ferroelectrics
- Vol. 62 (1) , 141-147
- https://doi.org/10.1080/10584580490456362
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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