Excess noise and mechanical stress in thin chromium films
- 1 February 1983
- journal article
- Published by Springer Nature in Radiophysics and Quantum Electronics
- Vol. 26 (2) , 162-166
- https://doi.org/10.1007/bf01039838
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Internal stresses in metallic films deposited by cylindrical magnetron sputteringThin Solid Films, 1979
- Excess () noise in metalsPhysical Review B, 1978
- The temperature dependence of stresses in aluminum films on oxidized silicon substratesThin Solid Films, 1978
- Crystal habit and crystal structure of fine chromium particles: An electron microscope and electron diffraction study of fine metallic particles prepared by evaporation in argon at low pressures (III)Thin Solid Films, 1974
- Thin Film PhenomenaJournal of the Electrochemical Society, 1970