X-ray microanalysis of thin foil Al-Ag alloys
- 1 October 1977
- journal article
- Published by IOP Publishing in Journal of Physics D: Applied Physics
- Vol. 10 (14) , 1883-1889
- https://doi.org/10.1088/0022-3727/10/14/004
Abstract
Measurements have been made of the intensity of Al and Ag X-rays generated from thin foils of Al alloys containing up to 22 wt.% Ag, using both wavelength and energy dispersive spectrometers and for electrons of energy between 45 and 100 keV. The intensity ratio I(Ag)/I(Al) would be expected to be constant with thickness but was found to increase up to six-fold for very thin foils. This anomaly prevents quantitative high resolution electron probe microanalysis using thin foils of this alloy.Keywords
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