Ellipsometric studies of polished silicon surfaces
- 31 May 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 55 (2) , 467-476
- https://doi.org/10.1016/0039-6028(76)90252-1
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
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