Characterization of graded refractive index silicon oxynitride thin films by spectroscopic ellipsometry
- 1 February 1998
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 313-314, 384-388
- https://doi.org/10.1016/s0040-6090(97)00851-1
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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