Influence of die attachment on MOS transistor matching

Publisher Website

24 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/icmts.1996.535617

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Mismatch characterization of small size MOS transistors
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
Piezoresistive simulation in MOSFETs
Sensors and Actuators A: Physical, 1993