A new model for computation of probabilistic testability in combinational circuits

This publication has 13 references indexed in Scilit:

• Statistical Fault Analysis
  IEEE Design & Test of Computers, 1985
• Good Controllability and Observability Do Not Guarantee Good Testability
  IEEE Transactions on Computers, 1983
• Expected value analysis of combinational logic networks
  IEEE Transactions on Circuits and Systems, 1981
• Syndrome-Testable Design of Combinational Circuits
  IEEE Transactions on Computers, 1980
• Controllability/observability analysis of digital circuits
  IEEE Transactions on Circuits and Systems, 1979
• Sequential Circuit Output Probabilities From Regular Expressions
  IEEE Transactions on Computers, 1978
• Probabilistic Treatment of General Combinational Networks
  IEEE Transactions on Computers, 1975
• The Probability of a Correct Output from a Combinational Circuit
  IEEE Transactions on Computers, 1975
• Analysis of Logic Circuits with Faults Using Input Signal Probabilities
  IEEE Transactions on Computers, 1975
• LAMP: Controllability, Observability, and Maintenance Engineering Technique (COMET)
  Bell System Technical Journal, 1974