Method for reduction of hysteresis effects in MIS measurements
- 1 April 1984
- journal article
- research article
- Published by Elsevier in Solid-State Electronics
- Vol. 27 (4) , 395-396
- https://doi.org/10.1016/0038-1101(84)90176-x
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
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- Determination of surface properties by means of large signal photovoltage pulses and the influence of trappingSurface Science, 1974
- Surface-state density and surface potential in MIS capacitors by surface photovoltage measurements. IJournal of Physics D: Applied Physics, 1971