Complementarity of RBS, PIGE and PIXE for the determination of surface layers of thicknesses up to 30 microns
- 1 April 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 49 (1-4) , 46-51
- https://doi.org/10.1016/0168-583x(90)90214-f
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
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