Multilayer pixe analysis
- 1 December 1987
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 29 (3) , 527-530
- https://doi.org/10.1016/0168-583x(87)90064-4
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Parametric determination of a Si(Li) detector efficiency curve using branching ratiosNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- The effect of oxides on PIXE measurementsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1985
- Specific applications of a 350 kv ion accelerator for PIXE analysis of solid state samplesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- A universal equation for the electronic stopping of ions in solidsPhysics Letters A, 1982
- Enhancement in PIXE analysisNuclear Instruments and Methods, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973