The effect of oxides on PIXE measurements
- 1 September 1985
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 12 (2) , 269-272
- https://doi.org/10.1016/0168-583x(85)90062-x
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- PIXE analysis of thick targetsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1984
- Uncertainties in thick-target PIXE analysisNuclear Instruments and Methods in Physics Research, 1983
- A universal equation for the electronic stopping of ions in solidsPhysics Letters A, 1982
- Uncertainties in theoretical thick target PIXE yieldsNuclear Instruments and Methods in Physics Research, 1981
- Enhancement in PIXE analysisNuclear Instruments and Methods, 1977
- Analytical application of particle induced X-ray emissionNuclear Instruments and Methods, 1976
- Quantitative analysis of complex targets by proton-induced x raysJournal of Applied Physics, 1975
- Inner-Shell Vacancy Production in Ion-Atom CollisionsReviews of Modern Physics, 1973
- Full-range solution for the measurement of thin-film surface densities with proton-excited x raysJournal of Applied Physics, 1972
- Range and stopping-power tables for heavy ionsAtomic Data and Nuclear Data Tables, 1970