Design for packageability-the impact of bonding technology on the size and layout of VLSI dies
- 30 December 2002
- proceedings article
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- p. 153-159
- https://doi.org/10.1109/mcmc.1993.302135
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
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