Ab initiostudy of the migration of intrinsic defects in
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- 3 November 2003
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 68 (20) , 205201
- https://doi.org/10.1103/physrevb.68.205201
Abstract
The diffusion of intrinsic defects in is studied using an ab initio method based on density functional theory. The vacancies are shown to migrate on their own sublattice. The carbon split-interstitials and the two relevant silicon interstitials, namely the tetrahedrally carbon-coordinated interstitial and the -oriented split interstitial, are found to be by far more mobile than the vacancies. The metastability of the silicon vacancy, which transforms into a vacancy-antisite complex in p-type and compensated material, kinetically suppresses its contribution to diffusion processes. The role of interstitials and vacancies in the self-diffusion is analyzed. Consequences for the dopant diffusion are qualitatively discussed. Our analysis emphasizes the relevance of mechanisms based on silicon and carbon interstitials.
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