Unidimensional Monte Carlo Simulation of the Secondary Scintillation of Xenon
- 1 January 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 30 (1) , 389-393
- https://doi.org/10.1109/tns.1983.4332296
Abstract
An unidimensional Monte Carlo method is used to calculate the secondary scintillation (electroluminescence) intensity in xenon gas proportional scintillation counters. Other transport parameters like electron drift time, average number of collisions, efficiency for light production and induced charge pulse amplitude are also calculated. The values obtained agree well with the experimental data available.Keywords
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