Range of slow positrons in metal overlayers on Al
- 19 February 1990
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 56 (8) , 728-730
- https://doi.org/10.1063/1.102694
Abstract
Polycrystalline Pd and amorphous PdTa films on Al substrates were studied by a variable energy positron beam and by Rutherford backscattering. Since positron diffusion in the overlayers is limited, the range follows directly from the Doppler broadening as a function of incident positron energy. To observe possible effects of positron backscattering, a sandwich of Al/Pd/Al was studied as well. It was found that the mean penetration depth is not described well by z̄(E)=A(μg/cm2)×En(E), if A and n are assumed to be material and energy independent.Keywords
This publication has 12 references indexed in Scilit:
- A study of Pd–Ta on Si(100) using Auger electron spectroscopy, Rutherford backscattering spectrometry, and variable energy positron annihilationJournal of Vacuum Science & Technology A, 1989
- Interaction of positron beams with surfaces, thin films, and interfacesReviews of Modern Physics, 1988
- SiO2/Si interface probed with a variable-energy positron beamApplied Physics Letters, 1987
- Profiling multilayer structures with monoenergetic positronsPhysical Review B, 1987
- The SiO2/Si Interface Probed With PositronsMRS Proceedings, 1987
- A semiautomatic algorithm for rutherford backscattering analysisNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1986
- Positron transmission and effective mass absorption coefficient in nickelApplied Physics A, 1984
- Observation of defects associated with the Cu/W(110) interface as studied with variable-energy positronsPhysical Review B, 1983
- Transmission of 1 - 6-keV positrons through thin metal filmsPhysical Review A, 1982
- Range-Energy Relations for Electrons and the Determination of Beta-Ray End-Point Energies by AbsorptionReviews of Modern Physics, 1952