Epitaxial erbium silicide films on(100) silicon: growth, structure and electrical properties
- 1 December 1997
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 120 (3-4) , 355-364
- https://doi.org/10.1016/s0169-4332(97)00382-6
Abstract
No abstract availableThis publication has 30 references indexed in Scilit:
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