Investigation of metal-semiconductor interface states by constant emission rate and constant capture rate capacitance spectroscopies
- 3 March 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 168 (1-3) , 830-837
- https://doi.org/10.1016/0039-6028(86)90916-7
Abstract
No abstract availableKeywords
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