A statistical method for calibrating the six-port reflectometer using nonideal standards
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 37 (11) , 1825-1828
- https://doi.org/10.1109/22.41055
Abstract
No abstract availableThis publication has 10 references indexed in Scilit:
- A new six-port calibration method using four standards and avoiding singularitiesIEEE Transactions on Instrumentation and Measurement, 1987
- An Explicit Six-Port Calibration Method Using Five Standards (Short Papers)IEEE Transactions on Microwave Theory and Techniques, 1985
- Optimal use of redundant information in multiport reflectometers by statistical methodsIEE Proceedings H Microwaves, Optics and Antennas, 1984
- A Six-Port Reflectometer and its Complete Characterization by Convenient Calibration ProceduresIEEE Transactions on Microwave Theory and Techniques, 1982
- A Least Squares Solution for Use in the Six-Port Measurement TechniqueIEEE Transactions on Microwave Theory and Techniques, 1980
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979
- Analysis and calibration theory of the general 6-port reflectometor employing four amplitude detectorsProceedings of the Institution of Electrical Engineers, 1979
- Using an Arbitrary Six-Port Junction to Measure Complex Voltage RatiosIEEE Transactions on Microwave Theory and Techniques, 1975
- Using six-port and eight-port junctions to measure active and passive circuit parametersPublished by National Institute of Standards and Technology (NIST) ,1975
- Calibration of an Arbitrary Six-Port Junction for Measurement of Active and Passive Circuit ParametersIEEE Transactions on Instrumentation and Measurement, 1973