Origin of azimuthal effect of RHEED intensity oscillations observed during MBE
- 1 May 1986
- journal article
- Published by Elsevier in Surface Science
- Vol. 171 (1) , L409-L414
- https://doi.org/10.1016/0039-6028(86)90552-2
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
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- Calculation of RHEED intensities from stepped surfacesSurface Science, 1984
- Phase-Locked Epitaxy Using RHEED Intensity OscillationJapanese Journal of Applied Physics, 1984
- RHEED oscillation studies of MBE growth kinetics and lattice mismatch strain-induced effects during InGaAs growth on GaAs(100)Journal of Vacuum Science & Technology B, 1984
- Damped oscillations in reflection high energy electron diffraction during GaAs MBEJournal of Vacuum Science & Technology B, 1983
- Dynamics of film growth of GaAs by MBE from Rheed observationsApplied Physics A, 1983