A self-aligned source/drain planar device for ultrahigh-speed GaAs MESFET VLSIs
- 1 January 1981
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
- Vol. XXIV, 218-219
- https://doi.org/10.1109/isscc.1981.1156230
Abstract
A self-aligned source/drain planar GaAs MESFET fabrication technique using high temperature stable Ti-W mixed metal gates as implantation masks will be reported. Propagation delays of 50ps have been attained from fully implanted1.5/mum-gate normally-off GaAs MESFET logic.Keywords
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