A self-aligned source/drain planar device for ultrahigh-speed GaAs MESFET VLSIs

Abstract
A self-aligned source/drain planar GaAs MESFET fabrication technique using high temperature stable Ti-W mixed metal gates as implantation masks will be reported. Propagation delays of 50ps have been attained from fully implanted1.5/mum-gate normally-off GaAs MESFET logic.

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