A CAD-oriented non-quasi-static approach for the transient analysis of MOS ICs
- 1 October 1986
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 21 (5) , 827-836
- https://doi.org/10.1109/jssc.1986.1052614
Abstract
No abstract availableKeywords
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