Characterization of thermal and deposited thin oxide layers by longitudinal optical-transverse optical excitation in fourier transform IR transmission measurements
- 1 July 1989
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 174, 159-164
- https://doi.org/10.1016/0040-6090(89)90885-7
Abstract
No abstract availableKeywords
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