A review of the skin effect as applied to thin film interconnections
- 1 January 1992
- journal article
- review article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Components, Hybrids, and Manufacturing Technology
- Vol. 15 (1) , 43-55
- https://doi.org/10.1109/33.124191
Abstract
No abstract availableThis publication has 48 references indexed in Scilit:
- Interconnection delay in very high-speed VLSIIEEE Transactions on Circuits and Systems, 1991
- Computation of transients in lossy VLSI packaging interconnectionsIEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1990
- Scattering parameter transient analysis of transmission lines loaded with nonlinear terminationsIEEE Transactions on Microwave Theory and Techniques, 1988
- Analysis of Lossy Transmission Lines with Arbitrary Nonlinear Terminal NetworksIEEE Transactions on Microwave Theory and Techniques, 1986
- Analysis of Finite Conductivity Cylindrical Conductors Excited by Axially-Independent TM Electromagnetic FieldIEEE Transactions on Microwave Theory and Techniques, 1985
- Coupled Lossy Transmission Line Characterization and SimulationIBM Journal of Research and Development, 1981
- Theory of power-frequency proximity effect for strip conductorsProceedings of the Institution of Electrical Engineers, 1975
- Inductance Calculations in a Complex Integrated Circuit EnvironmentIBM Journal of Research and Development, 1972
- Method of determining power-frequency current distribution in cylindrical conductorsProceedings of the Institution of Electrical Engineers, 1972
- Electromagnetic Theory and the Foundations of Electric Circuit Theory1Bell System Technical Journal, 1927