Detection of catastrophic faults in analog integrated circuits
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Vol. 8 (2) , 114-130
- https://doi.org/10.1109/43.21830
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
- Finding the convex hull facet by facetJournal of Algorithms, 1985
- A Pattern Recognition Based Method for IC Failure AnalysisIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1985
- Inductive Fault Analysis of MOS Integrated CircuitsIEEE Design & Test of Computers, 1985
- Computational Geometry—A SurveyIEEE Transactions on Computers, 1984
- FABRICS II: A Statistically Based IC Fabrication Process SimulatorIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1984
- Integrated circuit yield statisticsProceedings of the IEEE, 1983
- Band faults: Efficient approximations to fault bands for the simulation before fault diagnosis of linear circuitsIEEE Transactions on Circuits and Systems, 1982
- Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their TestabilityIEEE Transactions on Computers, 1980
- A dc approach for analog fault dictionary determinationIEEE Transactions on Circuits and Systems, 1979
- An Algorithm for Convex PolytopesJournal of the ACM, 1970