Observation and analysis of quantum wire structures by high-resolution X-ray diffraction
- 1 January 1992
- journal article
- Published by Elsevier in Surface Science
- Vol. 267 (1-3) , 227-231
- https://doi.org/10.1016/0039-6028(92)91126-v
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- X-ray diffraction from corrugated crystalline surfaces and interfacesApplied Physics Letters, 1990
- X-ray Bragg diffraction on periodic surface gratingsApplied Physics A, 1990
- Preparation of one-dimensional single and multi-layered quantum wire structures by ultrafine deep mesa etching techniquesMicroelectronic Engineering, 1989
- (AlAs)0.5(GaAs)0.5 fractional-layer superlattices grown on (001) vicinal surfaces by metalorganic chemical vapor depositionApplied Physics Letters, 1987
- Improved assessment of structural properties of As/GaAs heterostructures and superlattices by double-crystal x-ray diffractionPhysical Review B, 1986
- X-ray rocking curve analysis of superlatticesJournal of Applied Physics, 1984