Domination of adatom-induced over defect-induced surface states onp-type GaAs(Cs,O) at room temperature
- 15 August 1994
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review B
- Vol. 50 (8) , 5480-5483
- https://doi.org/10.1103/physrevb.50.5480
Abstract
The unpinned behavior of the Fermi level, photovoltage, and recombination velocity is demonstrated experimentally at room temperature for a p-type GaAs(Cs,O) interface by means of photoreflectance and photoluminescence techniques. This behavior manifests itself as the multiple reversible switching of surface band bending, the amplitude of photoreflectance, and photoluminescence intensity under alternate deposition of cesium and oxygen on a clean surface of epitaxial p-type GaAs layers. The results prove that cesium-induced donorlike surface states dominate over defect-induced states.Keywords
This publication has 22 references indexed in Scilit:
- Abrupt interfaces with novel structural and electronic properties: Metal-cluster deposition and metal-semiconductor junctionsPhysical Review B, 1990
- On the physics of metal-semiconductor interfacesReports on Progress in Physics, 1990
- Schottky-barrier formation at low metal coverages: A consistent molecular-orbital calculation for K on GaAs(110)Physical Review Letters, 1989
- The advanced unified defect model and its applicationsApplied Surface Science, 1988
- Effects of Na2S and (NH4)2S edge passivation treatments on the dark current-voltage characteristics of GaAs p n diodesApplied Physics Letters, 1988
- Band bending and interface states for metals on GaAsApplied Physics Letters, 1988
- Nearly ideal electronic properties of sulfide coated GaAs surfacesApplied Physics Letters, 1987
- Unified disorder induced gap state model for insulator–semiconductor and metal–semiconductor interfacesJournal of Vacuum Science & Technology B, 1986
- Schottky Barrier Heights and the Continuum of Gap StatesPhysical Review Letters, 1984
- New and unified model for Schottky barrier and III–V insulator interface states formationJournal of Vacuum Science and Technology, 1979