Cross-Sectional Transmission Electron Microscopy Observations and Selected-Area Electron Diffractions of Interfaces of Epitaxially Grown Diamond Thin Films on Cubic Boron Nitride Substrates
- 1 September 1993
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 32 (9R)
- https://doi.org/10.1143/jjap.32.3938
Abstract
No abstract availableKeywords
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