An experimental survey of heavy ion induced dielectric rupture in Actel Field Programmable Gate Arrays (FPGAs)
- 1 June 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 43 (3) , 967-972
- https://doi.org/10.1109/23.510741
Abstract
No abstract availableThis publication has 2 references indexed in Scilit:
- Single event gate rupture in commercial power MOSFETsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- SEU hardening of field programmable gate arrays (FPGAs) for space applications and device characterizationIEEE Transactions on Nuclear Science, 1994