The application of RHEED intensity effects to interrupted growth and interface formation during MBE growth of GaAs/(Al, Ga)As structures
- 1 March 1988
- journal article
- research article
- Published by Springer Nature in Applied Physics A
- Vol. 45 (3) , 255-260
- https://doi.org/10.1007/bf00615013
Abstract
No abstract availableKeywords
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