Automatic Noise Temperature Measurement through Frequency Variation
- 1 August 1982
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 30 (8) , 1286-1288
- https://doi.org/10.1109/tmtt.1982.1131242
Abstract
The dependence of two-port noise temperature on the source reflection factor does not lend itself to easy automated measurement. This paper shows that a noise analysis performed over a small frequency interval centered about the frequency of interest and with a source circuit having fast phase variations leads to a straightforward solution of the problem. The conditions for applying the procedure are broad enough to enable measuring most components like transistors and amplifiers over the entire microwave range. An example of practical implementation is presented.Keywords
This publication has 3 references indexed in Scilit:
- An Integrated Scattering- and Noise Parameter Measurement SystemPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1981
- A Wave Approach to the Noise Properties of Linear Microwave DevicesIEEE Transactions on Microwave Theory and Techniques, 1978
- A microwave noise and gain parameter test setPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1978