The influence of sample roughness on the quantification of micro-PIXE results
- 1 April 1990
- journal article
- Published by Elsevier in Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms
- Vol. 49 (1) , 74-77
- https://doi.org/10.1016/0168-583x(90)90219-k
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
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- Proton-induced X-ray emission in the trace analysis of human tooth enamel and dentineThe International Journal of Applied Radiation and Isotopes, 1976