The use of barrier parameters for the characterization of electron tunneling conductance curves
- 30 June 1978
- journal article
- Published by Elsevier in Solid State Communications
- Vol. 26 (12) , 949-952
- https://doi.org/10.1016/0038-1098(78)91259-0
Abstract
No abstract availableKeywords
This publication has 6 references indexed in Scilit:
- Instabilities in thin tunnel junctionsApplied Physics Letters, 1978
- A new approach to the elastic tunneling current in metal-insulator-metal diodesSurface Science, 1977
- Application of minicomputers in high resolution electron tunnelingReview of Scientific Instruments, 1975
- Ellipsometrical determination of barrier thicknesses of metal-insulator-metal tunnel junctionsSolid State Communications, 1973
- Tunneling Conductance of Asymmetrical BarriersJournal of Applied Physics, 1970
- Electric Tunnel Effect between Dissimilar Electrodes Separated by a Thin Insulating FilmJournal of Applied Physics, 1963