Evaluating PtSi front contact to surface barrier detectors
- 15 June 1977
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 143 (3) , 525-535
- https://doi.org/10.1016/0029-554x(77)90242-7
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Silicide formation correlated with surface resistivity measurementsPhysica Status Solidi (a), 1976
- The role of contacts to nuclear radiation detectorsNuclear Instruments and Methods, 1976
- Studies of formation of silicides and their barrier heights to siliconPhysica Status Solidi (a), 1973
- Principles and applications of ion beam techniques for the analysis of solids and thin filmsThin Solid Films, 1973
- Diode characteristics and edge effects of metal-semiconductor diodesSolid-State Electronics, 1973
- Growth Kinetics Observed in the Formation of Metal Silicides on SiliconApplied Physics Letters, 1972
- Detector Background and Sensitivity of Semiconductor X-Ray Fluorescence SpectrometersPublished by Springer Nature ,1972
- A new type of non-injecting back contact for totally depleted silicon surface barrier detectorsNuclear Instruments and Methods, 1971
- Reverse current-voltage characteristics of metal-silicide Schottky diodesSolid-State Electronics, 1970
- Silicon Schottky Barrier Diode with Near-Ideal I-V CharacteristicsBell System Technical Journal, 1968