Secondary emission properties as a function of the electron incidence angle
Open Access
- 1 April 1993
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Electron Devices
- Vol. 40 (4) , 824-829
- https://doi.org/10.1109/16.202797
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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- A Monte Carlo simulation of primary and secondary electron trajectories in a specimenJournal of Applied Physics, 1989
- Secondary electron emission characteristics of oxidized beryllium cathodesSurface and Interface Analysis, 1988
- The secondary electron emission coefficient of disordered surfacesSurface Science, 1980
- A Monte-Carlo calculation of the secondary electron emission of normal metals: I. The modelSurface Science, 1979
- Sekundärelektronen-Emission fester Körper bei Bestrahlung mit ElektronenPublished by Springer Nature ,1956