A linear statistical FET model using principal component analysis
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 37 (9) , 1389-1394
- https://doi.org/10.1109/22.32222
Abstract
No abstract availableThis publication has 4 references indexed in Scilit:
- FET model statistics and their effects on design centering and yield prediction for microwave amplifiersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A new method for determining the FET small-signal equivalent circuitIEEE Transactions on Microwave Theory and Techniques, 1988
- Circuit optimization: the state of the artIEEE Transactions on Microwave Theory and Techniques, 1988
- Centering and Tolerancing the Components of Microwave AmplifiersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1987