The characterization of highly-zinc-doped InP crystals
- 15 July 1979
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 35 (2) , 165-168
- https://doi.org/10.1063/1.91067
Abstract
Highly‐zinc‐doped InP crystals, grown along the 〈111〉 direction by the liquid‐encapsulated Czochralski technique, have been characterized by x‐ray topography, transmission cathodoluminescence, and transmission electron microscopy. It is observed that high zinc doping improves the perfection of crystals insofar as dislocations are concerned. However, not all of the dopant atoms are in solid solution, and it appears that some have clustered to form a high density (∼4×108 cm−2) of fine precipitates with an average size of ∼675 Å.Keywords
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