Single event effect and radiation damage results for candidate spacecraft electronics
- 27 November 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
We present both heavy ion and proton single event effect (SEE) and radiation damage ground test results for candidate spacecraft electronics. Devices tested include optocouplers, programmable devices, and fiber links.Keywords
This publication has 7 references indexed in Scilit:
- Single event effect testing of the Intel 80386 family and the 80486 microprocessorPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Emerging optocoupler issues with energetic particle-induced transients and permanent radiation degradationIEEE Transactions on Nuclear Science, 1998
- Emerging radiation hardness assurance (RHA) issues: a NASA approach for space flight programsIEEE Transactions on Nuclear Science, 1998
- Current radiation issues for programmable elements and devicesIEEE Transactions on Nuclear Science, 1998
- Comparison of MIL-STD-1773 fiber optic data bus terminals: single event proton test irradiation, in-flight space performance, and prediction techniquesIEEE Transactions on Nuclear Science, 1998
- Proton-induced transients in optocouplers: in-flight anomalies, ground irradiation test, mitigation and implicationsIEEE Transactions on Nuclear Science, 1997
- Total dose and proton damage in optocouplersIEEE Transactions on Nuclear Science, 1996