X-Ray diagnostics of 2D deformation profiles in crystals with periodically distorted near-surface region
- 16 April 1992
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 130 (2) , 263-271
- https://doi.org/10.1002/pssa.2211300202
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- X-ray diagnostics of 2D strain profiles in semiconductor crystalsSemiconductor Science and Technology, 1992
- X-ray diagnostics of the elastic stress gradient in crystalsPhysica Status Solidi (a), 1991
- Possibilities of X-Ray Interfernce Diffractometry for the Investigation of Ion-Doped LayersPhysica Status Solidi (a), 1990
- A Dynamical Theory of Diffraction for a Distorted CrystalJournal of the Physics Society Japan, 1969