Induced anisotropy in amorphous Co-Zr-M(M=Zr,Nb,Ti) and Co-Zr-Pt thin films: A magnetic and a structural study

Abstract
A magnetic and structural investigation was carried out on Co95x Zr5 Mx (M=Zr, Nb, or Ti) and Co91x Zr9 Ptx amorphous thin films in order to determine the physical origin of the induced in-plane uniaxial anisotropy Ku. The films were prepared by rf sputtering and the deposition was performed in a magnetic field. The variations of Ku were studied as a function of the sputtering parameters, composition, concentration, the thermomagnetic treatment, and structural-relaxation process. As a result of these investigations a model for the origin of Ku is advanced, which involves the single-ion anisotropy mechanism. Ku is the sum of two contributions Kua+Kus where Kua and Kus are the induced anisotropies related to the local anisotropy of the octahedral-icosahedral and trigonal-type clusters, respectively. The number of trigonal clusters varies as a function of PAr and thus explains the variation of Ku with PAr. In Co-Zr-Pt an extra contribution to Ku is observed due to the pseudodipolar ordering that results from the magnetic polarization of Pt. Co-Zr-Pt films exhibit a peculiar thermomagnetic relaxation that is explained by the reversibility of the pseudodipolar anisotropy and the thermal instability of trigonal-type clusters resulting from the substitution of Pt.