Measurement of small diffusion coefficients using ion-beam-sputtering as a microsectioning technique
- 1 February 1978
- journal article
- Published by Elsevier in Journal of Nuclear Materials
- Vol. 69-70, 545-548
- https://doi.org/10.1016/0022-3115(78)90269-6
Abstract
No abstract availableThis publication has 21 references indexed in Scilit:
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