Integration of algorithmic VLSI synthesis with testability incorporation
- 1 April 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 24 (2) , 409-417
- https://doi.org/10.1109/4.18602
Abstract
A VLSI design synthesis approach with testability, area, and delay constraints is presented. This research differs from other synthesizers by implementing testability as part of the VLSI design solution. A binary-tree data structure is used throughout the testable design search. Its bottom-up and top-down algorithms provide data-path allocation, constraint estimation, and feedback for design exploration. The partitioning and two-dimensional characteristics of the binary-tree structure provide VLSI design floorplans and global information for test incorporation. A differential equation and elliptical wave filter example were used to illustrate the design synthesis with testability constraints methodology. Test methodologies such as multiple-chain scan paths and BIST (built-in self-test) with different test schedules were explored. Design scores comprised of area, delay, fault coverage, and test time were computed and graphed.Keywords
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