Els investigation of the Si-Pd interface
- 1 November 1982
- journal article
- Published by Elsevier in Surface Science
- Vol. 122 (2) , 307-316
- https://doi.org/10.1016/0039-6028(82)90080-2
Abstract
No abstract availableKeywords
This publication has 16 references indexed in Scilit:
- Metal/silicon interface formation: The Ni/Si and Pd/Si systemsJournal of Vacuum Science and Technology, 1981
- Nature of the valence states in silicon transition metal interfacesSolid State Communications, 1981
- Chemical bonding and reactions at the Pd/Si interfacePhysical Review B, 1981
- Stoichiometric and Structural Origin of Electronic States at theSi-Si InterfacePhysical Review Letters, 1981
- Gold-Silicon Interface : Electron Energy Loss and Auger Spectroscopies Versus Gold CoveragePublished by Springer Nature ,1981
- Chemical bonding and electronic structure ofSiPhysical Review B, 1980
- The Si(111)–Pd interface: Spectroscopic evidence of chemical processes at liquid nitrogen temperatureJournal of Vacuum Science and Technology, 1980
- Microscopic Compound Formation at the Pd-Si(111) InterfacePhysical Review Letters, 1979
- Chemical and structural properties of the Pd/Si interface during the initial stages of silicide formationJournal of Vacuum Science and Technology, 1979
- Review of binary alloy formation by thin film interactionsJournal of Vacuum Science and Technology, 1979