Evaluation and Comparison of Selected WSI Reconfiguration Architectures in Terms of Yield and Yield per Area
- 1 January 1989
- book chapter
- Published by Springer Nature
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Techniques for implementing two-dimensional wafer-scale processor arraysIEE Proceedings E Computers and Digital Techniques, 1987
- On Area and Yield Considerations for Fault-Tolerant VLSI Processor ArraysIEEE Transactions on Computers, 1984
- The Diogenes Approach to Testable Fault-Tolerant Arrays of ProcessorsIEEE Transactions on Computers, 1983
- Integrated circuit yield statisticsProceedings of the IEEE, 1983