Improved calibration and measurement of the scattering parameters of microwave integrated circuits
- 1 January 1989
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 37 (11) , 1675-1680
- https://doi.org/10.1109/22.41030
Abstract
No abstract availableKeywords
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