Constricted dislocations and their use for TEM measurements of the velocities of edge and 60° dislocations in silicon. A new approach to the problem of kink migration
- 16 August 1993
- journal article
- research article
- Published by Wiley in Physica Status Solidi (a)
- Vol. 138 (2) , 547-555
- https://doi.org/10.1002/pssa.2211380223
Abstract
No abstract availableKeywords
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