"1 Thru+2.5 Reflects": A new technique for de-embedding MIC/MMIC device measurements in fixed-length fixtures
- 1 October 1996
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 5 references indexed in Scilit:
- A 40 to 50 GHz HEMT test fixturePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- The in-fixture calibration procedure line-network-network-LNNPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1993
- Theoretical and experimental characterization of coplanar waveguide discontinuities for filter applicationsIEEE Transactions on Microwave Theory and Techniques, 1991
- A generalized theory and new calibration procedures for network analyzer self-calibrationIEEE Transactions on Microwave Theory and Techniques, 1991
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979