A comparison of techniques for obtaining convergent beam electron diffraction patterns with a JEOL 200CX
- 31 December 1982
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 10 (3) , 217-222
- https://doi.org/10.1016/0304-3991(82)90041-9
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- A method of alignment for convergent beam diffraction in TEM mode for a JEM-100C electron microscopeUltramicroscopy, 1982
- Combining convergent-beam diffraction with high resolution imagingUltramicroscopy, 1981
- The determination of foil thickness by scanning transmission electron microscopyPhysica Status Solidi (a), 1975
- Electron diffraction study of MgOh00-systematic interactionsActa Crystallographica, 1967