Electron trap studies in Al-Ta-O/CdSe thin-film transistors using a hot electron injection method
- 15 January 1992
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 71 (2) , 786-790
- https://doi.org/10.1063/1.351344
Abstract
No abstract availableThis publication has 13 references indexed in Scilit:
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